Latest advances and applications of In situ contactless DLS for nanoparticle characterization
Palestrante: Dr. David Jacob – General Manager and Technical Director of Cordouan Technologies, Pessac, França
Resumo: Dynamic Light Scattering (DLS) has been a pivotal technique since the 1960s for measuring the size distribution of particles in suspension, particularly in nanomaterials. Today, DLS remains a gold standard for nanoparticle characterization due to its precision, non-invasiveness, and ability to analyze particles down to the sub-nanometer range, making it indispensable across various scientific and industrial applications. In this workshop we explore some recent advancements achieved in Cordouan technologies in nanoparticle characterization using Dynamic Light Scattering (DLS) technology. We’ll begin with a brief overview of our company, highlighting our expertise in innovative DLS solutions. Then, we’ll revisit the fundamentals of DLS, the cornerstone technique for accurate particle size measurement. Next, we’ll introduce our cutting-edge solutions for nanoparticle size characterization, focusing on the breakthrough of in situ, contactless DLS measurements — a true paradigm shift in the industry. You’ll also see real-world examples of applications and learn about our unique in-line measurement approach, featuring the milli-fluidic head concept. We’ll conclude with a live demonstration of in-line measurements using our VASCO KIN system, followed by a Q&A session to address your questions.
David Jacob, PhD, 58, is the General Manager, Technical Director and cofounder of Cordouan Technologies. He holds a Ph.D. in Laser Physics (1995) and an Engineering Diploma in Aeronautics (1991); David cumulate over 30 years of experience in the design and industrialization of optoelectronic systems. Since 2007, he has led collaborative R&D projects and the development of instruments for the physico-chemical characterization of nanoparticles at Cordouan. He is active in national and international standardization committees and has taught at the Universities of Nantes and Bordeaux. He holds 9 international patents in optical amplifiers and measurement systems. He has authored more than 20 peer-reviewed papers and contributed dozens of presentations and posters in international conferences.